Travelled to:1 × China
2 × USA
Collaborated with:S.X.Shi D.Z.Pan J.Mitra D.Z.Pan X.Han F.Ségonne A.K.Liu R.A.Poldrack P.Golland B.Fischl
Talks about:lithographi (2) variat (2) awar (2) discrimin (1) process (1) classif (1) surfac (1) detail (1) cortic (1) simul (1)
Person: Peng Yu
DBLP: Yu:Peng
Contributed to:
2006
20062005Wrote 3 papers:
- DAC-2006-YuSP #modelling #process
- Process variation aware OPC with variational lithography modeling (PY, SXS, DZP), pp. 785–790.
- ICPR-v3-2006-YuHSLPGF #classification
- Shape-based Discrimination and Classification of Cortical Surfaces (PY, XH, FS, AKL, RAP, PG, BF), pp. 445–448.
- DAC-2005-MitraYP #named #performance #simulation #using
- RADAR: RET-aware detailed routing using fast lithography simulations (JM, PY, DZP), pp. 369–372.