Simone Pampuri, Andrea Schirru, Giuseppe Fazio, Giuseppe De Nicolao
Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing
CASE, 2011.
@inproceedings{CASE-2011-PampuriSFN, author = "Simone Pampuri and Andrea Schirru and Giuseppe Fazio and Giuseppe De Nicolao", booktitle = "{Proceedings of the Seventh International Conference on Automation Science and Engineering}", doi = "10.1109/CASE.2011.6042425", isbn = "978-1-4577-1730-7", pages = "244--249", publisher = "{IEEE}", title = "{Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing}", year = 2011, }