Travelled to:
1 × Italy
Collaborated with:
S.Pampuri A.Schirru G.D.Nicolao
Talks about:
semiconductor (1) multilevel (1) manufactur (1) metrolog (1) virtual (1) lasso (1) appli (1)
Person: Giuseppe Fazio
DBLP: Fazio:Giuseppe
Contributed to:
Wrote 1 papers:
- CASE-2011-PampuriSFN #multi
- Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing (SP, AS, GF, GDN), pp. 244–249.