Travelled to:1 × Canada
1 × Italy
1 × Korea
Collaborated with:S.Pampuri A.Schirru C.D.Luca G.A.Susto A.Beghi G.Fazio Federica Acerbi Josef Obiltschnig Patrick Richter
Talks about:semiconductor (6) manufactur (6) process (4) metrolog (3) virtual (3) multilevel (2) approach (2) predict (2) mainten (2) control (2)
Person: Giuseppe De Nicolao
DBLP: Nicolao:Giuseppe_De
Contributed to:
2012201120102018Wrote 7 papers:
- CASE-2012-PampuriSSLBN #multi #process
- Multistep virtual metrology approaches for semiconductor manufacturing processes (SP, AS, GAS, CDL, AB, GDN), pp. 91–96.
- CASE-2012-SustoSPNB #approach
- An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control (GAS, AS, SP, GDN, AB), pp. 358–363.
- CASE-2011-PampuriSFN #multi
- Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing (SP, AS, GF, GDN), pp. 244–249.
- CASE-2011-PampuriSLN #maintenance #predict
- Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing (SP, AS, CDL, GDN), pp. 250–255.
- CASE-2010-SchirruPN #maintenance #predict #process #robust
- Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing (AS, SP, GDN), pp. 51–56.
- CASE-2010-SchirruPN10a #multi #process #statistics
- Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing (AS, SP, GDN), pp. 57–62.
- CASE-2018-AcerbiNORL #modelling #robust
- Accuracy and Robustness Against Covariate Shift of Water Chiller Models (FA, GDN, JO, PR, CDL), pp. 809–816.