Travelled to:
1 × Canada
1 × Italy
1 × Korea
1 × Taiwan
1 × USA
Collaborated with:
A.Schirru G.D.Nicolao G.A.Susto A.Beghi S.F.McLoone C.D.Luca J.Wan A.B.Johnston P.G.O'Hara G.Fazio D.Pagano M.Zanon
Talks about:
semiconductor (7) manufactur (7) process (5) predict (4) mainten (4) metrolog (3) virtual (3) multilevel (2) approach (2) control (2)
Person: Simone Pampuri
DBLP: Pampuri:Simone
Contributed to:
Wrote 9 papers:
- CASE-2014-PampuriSWJOM #process
- Insight extraction for semiconductor manufacturing processes (SP, GAS, JW, ABJ, PGO, SFM), pp. 786–791.
- CASE-2014-SustoWPZJOM #adaptation #flexibility #machine learning #maintenance #predict
- An adaptive machine learning decision system for flexible predictive maintenance (GAS, JW, SP, MZ, ABJ, PGO, SFM), pp. 806–811.
- CASE-2013-SustoSPPMB #fault #maintenance #predict
- A predictive maintenance system for integral type faults based on support vector machines: An application to ion implantation (GAS, AS, SP, DP, SFM, AB), pp. 195–200.
- CASE-2012-PampuriSSLBN #multi #process
- Multistep virtual metrology approaches for semiconductor manufacturing processes (SP, AS, GAS, CDL, AB, GDN), pp. 91–96.
- CASE-2012-SustoSPNB #approach
- An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control (GAS, AS, SP, GDN, AB), pp. 358–363.
- CASE-2011-PampuriSFN #multi
- Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing (SP, AS, GF, GDN), pp. 244–249.
- CASE-2011-PampuriSLN #maintenance #predict
- Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing (SP, AS, CDL, GDN), pp. 250–255.
- CASE-2010-SchirruPN #maintenance #predict #process #robust
- Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing (AS, SP, GDN), pp. 51–56.
- CASE-2010-SchirruPN10a #multi #process #statistics
- Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing (AS, SP, GDN), pp. 57–62.