Simone Pampuri, Andrea Schirru, Gian Antonio Susto, Cristina De Luca, Alessandro Beghi, Giuseppe De Nicolao
Multistep virtual metrology approaches for semiconductor manufacturing processes
CASE, 2012.
@inproceedings{CASE-2012-PampuriSSLBN,
author = "Simone Pampuri and Andrea Schirru and Gian Antonio Susto and Cristina De Luca and Alessandro Beghi and Giuseppe De Nicolao",
booktitle = "{Proceedings of the Eighth International Conference on Automation Science and Engineering}",
doi = "10.1109/CoASE.2012.6386484",
isbn = "978-1-4673-0429-0",
pages = "91--96",
publisher = "{IEEE}",
title = "{Multistep virtual metrology approaches for semiconductor manufacturing processes}",
year = 2012,
}











