Robust Delay-Fault Test Generation and Synthesis for Testability Under A Standard Scan Design Methodology
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Kwang-Ting Cheng, Srinivas Devadas, Kurt Keutzer
Robust Delay-Fault Test Generation and Synthesis for Testability Under A Standard Scan Design Methodology
DAC, 1991.

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@inproceedings{DAC-1991-ChengDK,
	author        = "Kwang-Ting Cheng and Srinivas Devadas and Kurt Keutzer",
	booktitle     = "{Proceedings of the 28th Design Automation Conference}",
	doi           = "10.1145/127601.127632",
	isbn          = "0-89791395-7",
	pages         = "80--86",
	publisher     = "{ACM}",
	title         = "{Robust Delay-Fault Test Generation and Synthesis for Testability Under A Standard Scan Design Methodology}",
	year          = 1991,
}

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