Allon Adir, Hezi Azatchi, Eyal Bin, Ofer Peled, Kirill Shoikhet
A generic micro-architectural test plan approach for microprocessor verification
DAC, 2005.
@inproceedings{DAC-2005-AdirABPS,
	author        = "Allon Adir and Hezi Azatchi and Eyal Bin and Ofer Peled and Kirill Shoikhet",
	booktitle     = "{Proceedings of the 42nd Design Automation Conference}",
	doi           = "10.1145/1065579.1065785",
	isbn          = "1-59593-058-2",
	pages         = "769--774",
	publisher     = "{ACM}",
	title         = "{A generic micro-architectural test plan approach for microprocessor verification}",
	year          = 2005,
}











