Allon Adir, Hezi Azatchi, Eyal Bin, Ofer Peled, Kirill Shoikhet
A generic micro-architectural test plan approach for microprocessor verification
DAC, 2005.
@inproceedings{DAC-2005-AdirABPS, author = "Allon Adir and Hezi Azatchi and Eyal Bin and Ofer Peled and Kirill Shoikhet", booktitle = "{Proceedings of the 42nd Design Automation Conference}", doi = "10.1145/1065579.1065785", isbn = "1-59593-058-2", pages = "769--774", publisher = "{ACM}", title = "{A generic micro-architectural test plan approach for microprocessor verification}", year = 2005, }