Allon Adir, Hezi Azatchi, Eyal Bin, Ofer Peled, Kirill Shoikhet
A generic micro-architectural test plan approach for microprocessor verification
DAC, 2005.
@inproceedings{DAC-2005-AdirABPS,
author = "Allon Adir and Hezi Azatchi and Eyal Bin and Ofer Peled and Kirill Shoikhet",
booktitle = "{Proceedings of the 42nd Design Automation Conference}",
doi = "10.1145/1065579.1065785",
isbn = "1-59593-058-2",
pages = "769--774",
publisher = "{ACM}",
title = "{A generic micro-architectural test plan approach for microprocessor verification}",
year = 2005,
}











