Ashish Srivastava, Saumil Shah, Kanak Agarwal, Dennis Sylvester, David Blaauw, Stephen W. Director
Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance
DAC, 2005.
@inproceedings{DAC-2005-SrivastavaSASBD,
author = "Ashish Srivastava and Saumil Shah and Kanak Agarwal and Dennis Sylvester and David Blaauw and Stephen W. Director",
booktitle = "{Proceedings of the 42nd Design Automation Conference}",
doi = "10.1145/1065579.1065718",
isbn = "1-59593-058-2",
pages = "535--540",
publisher = "{ACM}",
title = "{Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance}",
year = 2005,
}