Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
DAC, 2007.
@inproceedings{DAC-2007-AhmedTJ,
author = "Nisar Ahmed and Mohammad Tehranipoor and Vinay Jayaram",
booktitle = "{Proceedings of the 44th Design Automation Conference}",
doi = "10.1145/1278480.1278616",
pages = "533--538",
publisher = "{IEEE}",
title = "{Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design}",
year = 2007,
}