Michael E. Imhof, Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mäding, Jens Leenstra
Scan Test Planning for Power Reduction
DAC, 2007.
@inproceedings{DAC-2007-ImhofZWML,
author = "Michael E. Imhof and Christian G. Zoellin and Hans-Joachim Wunderlich and Nicolas Mäding and Jens Leenstra",
booktitle = "{Proceedings of the 44th Design Automation Conference}",
doi = "10.1145/1278480.1278614",
pages = "521--526",
publisher = "{IEEE}",
title = "{Scan Test Planning for Power Reduction}",
year = 2007,
}