Travelled to:1 × France
3 × USA
Collaborated with:H.Wunderlich M.E.Imhof M.A.Kochte J.Leenstra N.Mäding M.Schaal M.Elm R.S.Khaligh M.Radetzki S.D.Carlo P.Prinetto
Talks about:test (3) reduct (2) power (2) scan (2) processor (1) transact (1) cluster (1) explor (1) effici (1) valid (1)
Person: Christian G. Zoellin
DBLP: Zoellin:Christian_G=
Contributed to:
2010
200920082007Wrote 4 papers:
- DAC-2010-KochteSWZ #fault #manycore #performance #simulation
- Efficient fault simulation on many-core processors (MAK, MS, HJW, CGZ), pp. 380–385.
- DATE-2009-KochteZIKRWCP #modelling #transaction #using #validation
- Test exploration and validation using transaction level models (MAK, CGZ, MEI, RSK, MR, HJW, SDC, PP), pp. 1250–1253.
- DAC-2008-ElmWIZLM #clustering #reduction
- Scan chain clustering for test power reduction (ME, HJW, MEI, CGZ, JL, NM), pp. 828–833.
- DAC-2007-ImhofZWML #reduction #testing
- Scan Test Planning for Power Reduction (MEI, CGZ, HJW, NM, JL), pp. 521–526.