Travelled to:
1 × Germany
2 × USA
Collaborated with:
J.Leenstra H.Wunderlich M.E.Imhof C.G.Zoellin M.Elm J.Pille R.Sautter S.Büttner S.Ehrenreich W.Haller
Talks about:
processor (2) reduct (2) power (2) test (2) scan (2) architectur (1) synergist (1) element (1) cluster (1) vector (1)
Person: Nicolas Mäding
DBLP: M=auml=ding:Nicolas
Contributed to:
Wrote 3 papers:
- DAC-2008-ElmWIZLM #clustering #reduction
- Scan chain clustering for test power reduction (ME, HJW, MEI, CGZ, JL, NM), pp. 828–833.
- DAC-2007-ImhofZWML #reduction #testing
- Scan Test Planning for Power Reduction (MEI, CGZ, HJW, NM, JL), pp. 521–526.
- DATE-DF-2006-MadingLPSBEH #architecture #fixpoint
- The vector fixed point unit of the synergistic processor element of the cell architecture processor (NM, JL, JP, RS, SB, SE, WH), pp. 244–248.