A statistical simulation method for reliability analysis of SRAM core-cells
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Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
A statistical simulation method for reliability analysis of SRAM core-cells
DAC, 2010.

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@inproceedings{DAC-2010-FonsecaDBGPVB,
	author        = "Renan Alves Fonseca and Luigi Dilillo and Alberto Bosio and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Nabil Badereddine",
	booktitle     = "{Proceedings of the 47th Design Automation Conference}",
	doi           = "10.1145/1837274.1837487",
	isbn          = "978-1-4503-0002-5",
	pages         = "853--856",
	publisher     = "{ACM}",
	title         = "{A statistical simulation method for reliability analysis of SRAM core-cells}",
	year          = 2010,
}

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