Travelled to:1 × USA
2 × France
2 × Germany
Collaborated with:L.Dilillo P.Girard A.Virazel N.Badereddine A.Benso S.D.Carlo G.D.Natale P.Prinetto A.Touati P.Bernardi M.S.Reorda L.B.Zordan A.Todri R.A.Fonseca S.Pravossoudovitch J.Azevedo A.Todri-Sanial G.Prenat J.Alvarez-Herault K.Mackay
Talks about:test (4) sram (3) impact (2) power (2) fault (2) architectur (1) function (1) statist (1) reliabl (1) program (1)
Person: Alberto Bosio
DBLP: Bosio:Alberto
Contributed to:
201520132012
20102006Wrote 5 papers:
- DATE-2015-TouatiBDGVBR #functional #power management #source code #testing
- Exploring the impact of functional test programs re-used for power-aware testing (AT, AB, LD, PG, AV, PB, MSR), pp. 1277–1280.
- DATE-2013-ZordanBDGTVB #fault #power management
- Test solution for data retention faults in low-power SRAMs (LBZ, AB, LD, PG, AT, AV, NB), pp. 442–447.
- DATE-2012-AzevedoVBDGTPAM #architecture #fault
- Impact of resistive-open defects on the heat current of TAS-MRAM architectures (JA, AV, AB, LD, PG, ATS, GP, JAH, KM), pp. 532–537.
- DAC-2010-FonsecaDBGPVB #analysis #reliability #simulation #statistics
- A statistical simulation method for reliability analysis of SRAM core-cells (RAF, LD, AB, PG, SP, AV, NB), pp. 853–856.
- DATE-2006-BensoBCNP #automation #fault #testing
- Automatic march tests generations for static linked faults in SRAMs (AB, AB, SDC, GDN, PP), pp. 1258–1263.