Optimal periodic testing of intermittent faults in embedded pipelined processor applications
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Nektarios Kranitis, Andreas Merentitis, N. Laoutaris, George Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos, Constantin Halatsis
Optimal periodic testing of intermittent faults in embedded pipelined processor applications
DATE, 2006.

DATE 2006
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@inproceedings{DATE-2006-KranitisMLTPGH,
	author        = "Nektarios Kranitis and Andreas Merentitis and N. Laoutaris and George Theodorou and Antonis M. Paschalis and Dimitris Gizopoulos and Constantin Halatsis",
	booktitle     = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/1131500",
	pages         = "65--70",
	publisher     = "{European Design and Automation Association, Leuven, Belgium}",
	title         = "{Optimal periodic testing of intermittent faults in embedded pipelined processor applications}",
	year          = 2006,
}

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