Nektarios Kranitis, Andreas Merentitis, N. Laoutaris, George Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos, Constantin Halatsis
Optimal periodic testing of intermittent faults in embedded pipelined processor applications
DATE, 2006.
@inproceedings{DATE-2006-KranitisMLTPGH,
author = "Nektarios Kranitis and Andreas Merentitis and N. Laoutaris and George Theodorou and Antonis M. Paschalis and Dimitris Gizopoulos and Constantin Halatsis",
booktitle = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1131500",
pages = "65--70",
publisher = "{European Design and Automation Association, Leuven, Belgium}",
title = "{Optimal periodic testing of intermittent faults in embedded pipelined processor applications}",
year = 2006,
}
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