Travelled to:
1 × USA
4 × France
5 × Germany
Collaborated with:
D.Gizopoulos N.Kranitis Y.Zorian M.Psarakis A.Apostolakis N.Gaitanis P.Kostarakis G.Xenoulis M.Hatzimihail A.Raghunathan S.Ravi A.Merentitis N.Laoutaris G.Theodorou C.Halatsis
Talks about:
test (8) self (7) processor (6) softwar (5) base (5) effect (4) core (4) embed (3) pipelin (2) period (2)
Person: Antonis M. Paschalis
DBLP: Paschalis:Antonis_M=
Contributed to:
Wrote 10 papers:
- DATE-2008-ApostolakisGPP #functional #multi #self #symmetry
- Functional Self-Testing for Bus-Based Symmetric Multiprocessors (AA, DG, MP, AMP), pp. 1304–1309.
- DAC-2006-PsarakisGHPRR #pipes and filters #self
- Systematic software-based self-test for pipelined processors (MP, DG, MH, AMP, AR, SR), pp. 393–398.
- DATE-2006-KranitisMLTPGH #embedded #fault #pipes and filters #testing
- Optimal periodic testing of intermittent faults in embedded pipelined processor applications (NK, AM, NL, GT, AMP, DG, CH), pp. 65–70.
- DATE-v1-2004-PaschalisG #effectiveness #embedded #online #self #testing
- Effective Software-Based Self-Test Strategies for On-Line Periodic Testing of Embedded Processors (AMP, DG), pp. 578–583.
- DATE-2003-KranitisXGPZ #low cost #self
- Low-Cost Software-Based Self-Testing of RISC Processor Cores (NK, GX, DG, AMP, YZ), pp. 10714–10719.
- DATE-2002-KranitisPGZ #effectiveness #self
- Effective Software Self-Test Methodology for Processor Cores (NK, AMP, DG, YZ), pp. 592–597.
- DATE-2001-PaschalisGKPZ #embedded #self
- Deterministic software-based self-testing of embedded processor cores (AMP, DG, NK, MP, YZ), pp. 92–96.
- DATE-2000-GizopoulosKPPZ #effectiveness #power management
- Effective Low Power BIST for Datapaths (DG, NK, MP, AMP, YZ), p. 757.
- DATE-1999-PaschalisKPGZ #architecture #effectiveness #multi #performance
- An Effective BIST Architecture for Fast Multiplier Cores (AMP, NK, MP, DG, YZ), pp. 117–121.
- EDTC-1997-PaschalisGGK #fault #self
- A totally self-checking 1-out-of-3 code error indicator (AMP, NG, DG, PK), pp. 450–454.