Travelled to:
2 × France
4 × Germany
Collaborated with:
A.M.Paschalis D.Gizopoulos Y.Zorian M.Psarakis G.Xenoulis A.Merentitis N.Laoutaris G.Theodorou C.Halatsis
Talks about:
processor (4) test (4) core (4) softwar (3) effect (3) self (3) embed (2) bist (2) base (2) low (2)
Person: Nektarios Kranitis
DBLP: Kranitis:Nektarios
Contributed to:
Wrote 6 papers:
- DATE-2006-KranitisMLTPGH #embedded #fault #pipes and filters #testing
- Optimal periodic testing of intermittent faults in embedded pipelined processor applications (NK, AM, NL, GT, AMP, DG, CH), pp. 65–70.
- DATE-2003-KranitisXGPZ #low cost #self
- Low-Cost Software-Based Self-Testing of RISC Processor Cores (NK, GX, DG, AMP, YZ), pp. 10714–10719.
- DATE-2002-KranitisPGZ #effectiveness #self
- Effective Software Self-Test Methodology for Processor Cores (NK, AMP, DG, YZ), pp. 592–597.
- DATE-2001-PaschalisGKPZ #embedded #self
- Deterministic software-based self-testing of embedded processor cores (AMP, DG, NK, MP, YZ), pp. 92–96.
- DATE-2000-GizopoulosKPPZ #effectiveness #power management
- Effective Low Power BIST for Datapaths (DG, NK, MP, AMP, YZ), p. 757.
- DATE-1999-PaschalisKPGZ #architecture #effectiveness #multi #performance
- An Effective BIST Architecture for Fast Multiplier Cores (AMP, NK, MP, DG, YZ), pp. 117–121.