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Travelled to:
2 × France
4 × Germany
Collaborated with:
A.M.Paschalis D.Gizopoulos Y.Zorian M.Psarakis G.Xenoulis A.Merentitis N.Laoutaris G.Theodorou C.Halatsis
Talks about:
processor (4) test (4) core (4) softwar (3) effect (3) self (3) embed (2) bist (2) base (2) low (2)

Person: Nektarios Kranitis

DBLP DBLP: Kranitis:Nektarios

Contributed to:

DATE 20062006
DATE 20032003
DATE 20022002
DATE 20012001
DATE 20002000
DATE 19991999

Wrote 6 papers:

DATE-2006-KranitisMLTPGH #embedded #fault #pipes and filters #testing
Optimal periodic testing of intermittent faults in embedded pipelined processor applications (NK, AM, NL, GT, AMP, DG, CH), pp. 65–70.
DATE-2003-KranitisXGPZ #low cost #self
Low-Cost Software-Based Self-Testing of RISC Processor Cores (NK, GX, DG, AMP, YZ), pp. 10714–10719.
DATE-2002-KranitisPGZ #effectiveness #self
Effective Software Self-Test Methodology for Processor Cores (NK, AMP, DG, YZ), pp. 592–597.
DATE-2001-PaschalisGKPZ #embedded #self
Deterministic software-based self-testing of embedded processor cores (AMP, DG, NK, MP, YZ), pp. 92–96.
DATE-2000-GizopoulosKPPZ #effectiveness #power management
Effective Low Power BIST for Datapaths (DG, NK, MP, AMP, YZ), p. 757.
DATE-1999-PaschalisKPGZ #architecture #effectiveness #multi #performance
An Effective BIST Architecture for Fast Multiplier Cores (AMP, NK, MP, DG, YZ), pp. 117–121.

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