Travelled to:1 × USA
5 × Germany
6 × France
Collaborated with:A.M.Paschalis N.Kranitis M.Psarakis Y.Zorian K.Roy A.Apostolakis S.Mitra P.Sanda N.Gaitanis P.Kostarakis P.Girard N.Nicolici X.Wen G.Xenoulis S.Hamdioui M.Nicolaidis A.Grasset G.Groeseneken P.Bonnot M.Hatzimihail A.Raghunathan S.Ravi A.Merentitis N.Laoutaris G.Theodorou C.Halatsis S.V.Adve P.Ramachandran S.K.S.Hari D.J.Sorin A.Meixner A.Biswas X.Vera
Talks about:test (10) processor (7) self (7) softwar (5) effect (5) base (5) core (4) power (3) error (3) embed (3)
Person: Dimitris Gizopoulos
DBLP: Gizopoulos:Dimitris
Contributed to:
201320112008
200620062004200320022001200019991997Wrote 14 papers:
- DATE-2013-HamdiouiNGGGB #challenge #realtime #reliability
- Reliability challenges of real-time systems in forthcoming technology nodes (SH, MN, DG, AG, GG, PB), pp. 129–134.
- DATE-2011-GizopoulosPARHSMBV #architecture #detection #fault #manycore #online
- Architectures for online error detection and recovery in multicore processors (DG, MP, SVA, PR, SKSH, DJS, AM, AB, XV), pp. 533–538.
- DATE-2008-ApostolakisGPP #functional #multi #self #symmetry
- Functional Self-Testing for Bus-Based Symmetric Multiprocessors (AA, DG, MP, AMP), pp. 1304–1309.
- DATE-2008-GizopoulosRGNW #power management #testing
- Power-Aware Testing and Test Strategies for Low Power Devices (DG, KR, PG, NN, XW).
- DATE-2008-GizopoulosRMS #case study #fault
- Soft Errors: System Effects, Protection Techniques and Case Studies (DG, KR, SM, PS).
- DAC-2006-PsarakisGHPRR #pipes and filters #self
- Systematic software-based self-test for pipelined processors (MP, DG, MH, AMP, AR, SR), pp. 393–398.
- DATE-2006-KranitisMLTPGH #embedded #fault #pipes and filters #testing
- Optimal periodic testing of intermittent faults in embedded pipelined processor applications (NK, AM, NL, GT, AMP, DG, CH), pp. 65–70.
- DATE-v1-2004-PaschalisG #effectiveness #embedded #online #self #testing
- Effective Software-Based Self-Test Strategies for On-Line Periodic Testing of Embedded Processors (AMP, DG), pp. 578–583.
- DATE-2003-KranitisXGPZ #low cost #self
- Low-Cost Software-Based Self-Testing of RISC Processor Cores (NK, GX, DG, AMP, YZ), pp. 10714–10719.
- DATE-2002-KranitisPGZ #effectiveness #self
- Effective Software Self-Test Methodology for Processor Cores (NK, AMP, DG, YZ), pp. 592–597.
- DATE-2001-PaschalisGKPZ #embedded #self
- Deterministic software-based self-testing of embedded processor cores (AMP, DG, NK, MP, YZ), pp. 92–96.
- DATE-2000-GizopoulosKPPZ #effectiveness #power management
- Effective Low Power BIST for Datapaths (DG, NK, MP, AMP, YZ), p. 757.
- DATE-1999-PaschalisKPGZ #architecture #effectiveness #multi #performance
- An Effective BIST Architecture for Fast Multiplier Cores (AMP, NK, MP, DG, YZ), pp. 117–121.
- EDTC-1997-PaschalisGGK #fault #self
- A totally self-checking 1-out-of-3 code error indicator (AMP, NG, DG, PK), pp. 450–454.