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Travelled to:
1 × USA
5 × Germany
6 × France
Collaborated with:
A.M.Paschalis N.Kranitis M.Psarakis Y.Zorian K.Roy A.Apostolakis S.Mitra P.Sanda N.Gaitanis P.Kostarakis P.Girard N.Nicolici X.Wen G.Xenoulis S.Hamdioui M.Nicolaidis A.Grasset G.Groeseneken P.Bonnot M.Hatzimihail A.Raghunathan S.Ravi A.Merentitis N.Laoutaris G.Theodorou C.Halatsis S.V.Adve P.Ramachandran S.K.S.Hari D.J.Sorin A.Meixner A.Biswas X.Vera
Talks about:
test (10) processor (7) self (7) softwar (5) effect (5) base (5) core (4) power (3) error (3) embed (3)

Person: Dimitris Gizopoulos

DBLP DBLP: Gizopoulos:Dimitris

Contributed to:

DATE 20132013
DATE 20112011
DATE 20082008
DAC 20062006
DATE 20062006
DATE v1 20042004
DATE 20032003
DATE 20022002
DATE 20012001
DATE 20002000
DATE 19991999
ED&TC 19971997

Wrote 14 papers:

DATE-2013-HamdiouiNGGGB #challenge #realtime #reliability
Reliability challenges of real-time systems in forthcoming technology nodes (SH, MN, DG, AG, GG, PB), pp. 129–134.
DATE-2011-GizopoulosPARHSMBV #architecture #detection #fault #manycore #online
Architectures for online error detection and recovery in multicore processors (DG, MP, SVA, PR, SKSH, DJS, AM, AB, XV), pp. 533–538.
DATE-2008-ApostolakisGPP #functional #multi #self #symmetry
Functional Self-Testing for Bus-Based Symmetric Multiprocessors (AA, DG, MP, AMP), pp. 1304–1309.
DATE-2008-GizopoulosRGNW #power management #testing
Power-Aware Testing and Test Strategies for Low Power Devices (DG, KR, PG, NN, XW).
DATE-2008-GizopoulosRMS #case study #fault
Soft Errors: System Effects, Protection Techniques and Case Studies (DG, KR, SM, PS).
DAC-2006-PsarakisGHPRR #pipes and filters #self
Systematic software-based self-test for pipelined processors (MP, DG, MH, AMP, AR, SR), pp. 393–398.
DATE-2006-KranitisMLTPGH #embedded #fault #pipes and filters #testing
Optimal periodic testing of intermittent faults in embedded pipelined processor applications (NK, AM, NL, GT, AMP, DG, CH), pp. 65–70.
DATE-v1-2004-PaschalisG #effectiveness #embedded #online #self #testing
Effective Software-Based Self-Test Strategies for On-Line Periodic Testing of Embedded Processors (AMP, DG), pp. 578–583.
DATE-2003-KranitisXGPZ #low cost #self
Low-Cost Software-Based Self-Testing of RISC Processor Cores (NK, GX, DG, AMP, YZ), pp. 10714–10719.
DATE-2002-KranitisPGZ #effectiveness #self
Effective Software Self-Test Methodology for Processor Cores (NK, AMP, DG, YZ), pp. 592–597.
DATE-2001-PaschalisGKPZ #embedded #self
Deterministic software-based self-testing of embedded processor cores (AMP, DG, NK, MP, YZ), pp. 92–96.
DATE-2000-GizopoulosKPPZ #effectiveness #power management
Effective Low Power BIST for Datapaths (DG, NK, MP, AMP, YZ), p. 757.
DATE-1999-PaschalisKPGZ #architecture #effectiveness #multi #performance
An Effective BIST Architecture for Fast Multiplier Cores (AMP, NK, MP, DG, YZ), pp. 117–121.
EDTC-1997-PaschalisGGK #fault #self
A totally self-checking 1-out-of-3 code error indicator (AMP, NG, DG, PK), pp. 450–454.

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