Georges G. E. Gielen, Peter H. N. De Wit, Elie Maricau, J. Loeckx, Javier Martín-Martínez, Ben Kaczer, Guido Groeseneken, Rosana Rodríguez, Montserrat Nafría
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies
DATE, 2008.
@inproceedings{DATE-2008-GielenWMLMKGRN,
author = "Georges G. E. Gielen and Peter H. N. De Wit and Elie Maricau and J. Loeckx and Javier Martín-Martínez and Ben Kaczer and Guido Groeseneken and Rosana Rodríguez and Montserrat Nafría",
booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2008.4484862",
isbn = "978-3-9810801-3-1",
pages = "1322--1327",
publisher = "{IEEE}",
title = "{Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies}",
year = 2008,
}
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