BibSLEIGH corpus
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Open Knowledge
XHTML 1.0 W3C Rec
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Travelled to:
2 × Germany
Collaborated with:
S.Khan I.Agbo S.Hamdioui H.Kukner P.Raghavan F.Catthoor G.G.E.Gielen P.H.N.D.Wit E.Maricau J.Loeckx J.Martín-Martínez G.Groeseneken R.Rodríguez M.Nafría
Talks about:
temperatur (1) technolog (1) challeng (1) reliabl (1) nanomet (1) instabl (1) analysi (1) yield (1) emerg (1) sram (1)

Person: Ben Kaczer

DBLP DBLP: Kaczer:Ben

Contributed to:

DATE 20142014
DATE 20082008

Wrote 2 papers:

DATE-2014-KhanAHKKRC #analysis #bias
Bias Temperature Instability analysis of FinFET based SRAM cells (SK, IA, SH, HK, BK, PR, FC), pp. 1–6.
DATE-2008-GielenWMLMKGRN #challenge #reliability
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies (GGEG, PHNDW, EM, JL, JMM, BK, GG, RR, MN), pp. 1322–1327.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.