Travelled to:
1 × Germany
Collaborated with:
G.G.E.Gielen P.H.N.D.Wit E.Maricau J.Martín-Martínez B.Kaczer G.Groeseneken R.Rodríguez M.Nafría
Talks about:
technolog (1) challeng (1) reliabl (1) nanomet (1) yield (1) emerg (1) cmos (1)
Person: J. Loeckx
DBLP: Loeckx:J=
Contributed to:
Wrote 1 papers:
- DATE-2008-GielenWMLMKGRN #challenge #reliability
- Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies (GGEG, PHNDW, EM, JL, JMM, BK, GG, RR, MN), pp. 1322–1327.