@inproceedings{DATE-2012-AzevedoVBDGTPAM,
	acmid         = "2492840",
	author        = "João Azevedo and Arnaud Virazel and Alberto Bosio and Luigi Dilillo and Patrick Girard and Aida Todri-Sanial and G. Prenat and Jérémy Alvarez-Herault and Ken Mackay",
	booktitle     = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-1-4577-2145-8",
	pages         = "532--537",
	publisher     = "{IEEE}",
	title         = "{Impact of resistive-open defects on the heat current of TAS-MRAM architectures}",
	year          = 2012,
}