Exploiting expendable process-margins in DRAMs for run-time performance optimization
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Karthik Chandrasekar, Sven Goossens, Christian Weis, Martijn Koedam, Benny Akesson, Norbert Wehn, Kees Goossens
Exploiting expendable process-margins in DRAMs for run-time performance optimization
DATE, 2014.

DATE 2014
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@inproceedings{DATE-2014-0001GWKAWG,
	author        = "Karthik Chandrasekar and Sven Goossens and Christian Weis and Martijn Koedam and Benny Akesson and Norbert Wehn and Kees Goossens",
	booktitle     = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.7873/DATE.2014.186",
	pages         = "1--6",
	publisher     = "{IEEE}",
	title         = "{Exploiting expendable process-margins in DRAMs for run-time performance optimization}",
	year          = 2014,
}

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