Seyab Khan, Innocent Agbo, Said Hamdioui, Halil Kukner, Ben Kaczer, Praveen Raghavan, Francky Catthoor
Bias Temperature Instability analysis of FinFET based SRAM cells
DATE, 2014.
@inproceedings{DATE-2014-KhanAHKKRC,
author = "Seyab Khan and Innocent Agbo and Said Hamdioui and Halil Kukner and Ben Kaczer and Praveen Raghavan and Francky Catthoor",
booktitle = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.7873/DATE.2014.044",
pages = "1--6",
publisher = "{IEEE}",
title = "{Bias Temperature Instability analysis of FinFET based SRAM cells}",
year = 2014,
}