Travelled to:1 × Germany
Collaborated with:I.Agbo S.Hamdioui H.Kukner B.Kaczer P.Raghavan F.Catthoor
Talks about:temperatur (1) instabl (1) analysi (1) sram (1) cell (1) bias (1) base (1) fin (1) fet (1)
Person: Seyab Khan
DBLP: Khan:Seyab
Contributed to:
2014Wrote 1 papers:
- DATE-2014-KhanAHKKRC #analysis #bias
- Bias Temperature Instability analysis of FinFET based SRAM cells (SK, IA, SH, HK, BK, PR, FC), pp. 1–6.