Pattern Selection for Testing of Deep Sub-Micron Timing Defects
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Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng
Pattern Selection for Testing of Deep Sub-Micron Timing Defects
DATE, 2004.

DATE v2 2004
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@inproceedings{DATE-v2-2004-MangoCWC,
	author        = "Mango Chia-Tso Chao and Li-C. Wang and Kwang-Ting Cheng",
	booktitle     = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 2}",
	ee            = "http://csdl.computer.org/comp/proceedings/date/2004/2085/02/20852160abs.htm",
	isbn          = "0-7695-2085-5",
	pages         = "160",
	publisher     = "{IEEE Computer Society}",
	title         = "{Pattern Selection for Testing of Deep Sub-Micron Timing Defects}",
	year          = 2004,
}

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