Travelled to:2 × USA
Collaborated with:J.Cong J.Mitra P.Yu H.Ren C.J.Alpert P.Villarrubia
Talks about:interconnect (1) lithographi (1) submicron (1) placement (1) migrat (1) diffus (1) detail (1) design (1) simul (1) radar (1)
Person: David Zhigang Pan
DBLP: Pan:David_Zhigang
Contributed to:
20051999Wrote 3 papers:
- DAC-2005-MitraYP #named #performance #simulation #using
- RADAR: RET-aware detailed routing using fast lithography simulations (JM, PY, DZP), pp. 369–372.
- DAC-2005-RenPAV #migration
- Diffusion-based placement migration (HR, DZP, CJA, PV), pp. 515–520.
- DAC-1999-CongP #design #estimation
- Interconnect Estimation and Dlanning for Deep Submicron Designs (JC, DZP), pp. 507–510.