Travelled to:2 × USA
Collaborated with:K.Roy S.K.Gupta K.Kim S.P.Park
Talks about:technolog (1) interact (1) process (1) circuit (1) voltag (1) variat (1) applic (1) ultra (1) toler (1) devic (1)
Person: Jaydeep P. Kulkarni
DBLP: Kulkarni:Jaydeep_P=
Contributed to:
20092008Wrote 2 papers:
- DAC-2009-RoyKG #interactive
- Device/circuit interactions at 22nm technology node (KR, JPK, SKG), pp. 97–102.
- DAC-2008-KulkarniKPR #array #process
- Process variation tolerant SRAM array for ultra low voltage applications (JPK, KK, SPP, KR), pp. 108–113.