Travelled to:
1 × Germany
2 × France
Collaborated with:
Y.Hu X.Li X.Zhang
Talks about:
diagnosi (2) multipl (2) fault (2) arbitrari (1) reinforc (1) silicon (1) respons (1) compact (1) variat (1) layout (1)
Person: Jing Ye
DBLP: Ye:Jing
Contributed to:
Wrote 3 papers:
- DATE-2013-ZhangYH0 #testing
- Capturing post-silicon variation by layout-aware path-delay testing (XZ, JY, YH, XL), pp. 288–291.
- DATE-2011-YeHL #fault #multi #on the #using
- On diagnosis of multiple faults using compacted responses (JY, YH, XL), pp. 679–684.
- DATE-2010-YeHL #fault #multi
- Diagnosis of multiple arbitrary faults with mask and reinforcement effect (JY, YH, XL), pp. 885–890.