Travelled to:1 × Canada
1 × China
1 × USA
Collaborated with:S.Niu J.Yi S.Ding K.Goldberg Z.Zhang L.Zheng J.Fu E.Zu P.v.d.Meulen R.Akhavan-Tabatabaei M.Mai Q.Li S.Sweat
Talks about:semiconductor (4) manufactur (4) multi (3) product (2) multipl (2) factori (2) cluster (2) assembl (2) optim (2) capac (2)
Person: Mike Tao Zhang
DBLP: Zhang:Mike_Tao
Contributed to:
200720062005Wrote 7 papers:
- CASE-2007-YiDZ0 #analysis #clustering #linear #throughput #tool support
- Throughput Analysis of Linear Cluster Tools (JY, SD, MTZ, PvdM), pp. 1063–1068.
- CASE-2007-ZhangG #approach
- Calibration of Wafer Handling Robots: A Fixturing Approach (MTZ, KG), pp. 255–260.
- CASE-2006-DingYZA #clustering #evaluation #multi #nondeterminism #optimisation #performance #process #tool support
- Performance Evaluation and Schedule Optimization of Multi-Cluster Tools with Process Times Uncertainty (SD, JY, MTZ, RAT), pp. 112–117.
- CASE-2006-SweatNZZZ #assembly #capacity #multi
- Multi-factory capacity planning in semiconductor assembly and test manufacturing with multiple-chip products (SS, SN, MTZ, ZZ, LZ), pp. 247–252.
- CASE-2005-ZhangFZ #assembly #capacity #modelling #multi #workflow
- Dynamic capacity modeling with multiple re-entrant workflows in semiconductor assembly manufacturing (MTZ, JF, EZ), pp. 160–165.
- CASE-2005-ZhangNML #configuration management #multi #optimisation
- Multi-factory optimization enables kit reconfiguration in semiconductor manufacturing (MTZ, SN, MM, QL), pp. 105–112.
- CASE-2005-ZhangZNZ
- Production planning with joint resources usage semiconductor test manufacturing (ZZ, MTZ, SN, LZ), pp. 49–54.