Travelled to:
1 × France
1 × Germany
1 × USA
Collaborated with:
V.Bertacco K.Constantinides T.M.Austin S.Phadke M.Mehrara M.Attariyan
Talks about:
protect (2) defect (2) cost (2) low (2) microprocessor (1) silicon (1) pipelin (1) distanc (1) hybrid (1) verif (1)
Person: Smitha Shyam
DBLP: Shyam:Smitha
Contributed to:
Wrote 3 papers:
- DATE-2007-MehraraASCBA #fault #low cost
- Low-cost protection for SER upsets and silicon defects (MM, MA, SS, KC, VB, TMA), pp. 1146–1151.
- ASPLOS-2006-ShyamCPBA #fault #low cost #pipes and filters
- Ultra low-cost defect protection for microprocessor pipelines (SS, KC, SP, VB, TMA), pp. 73–82.
- DATE-2006-ShyamB #hybrid #verification
- Distance-guided hybrid verification with GUIDO (SS, VB), pp. 1211–1216.