Travelled to:1 × France
2 × USA
Collaborated with:M.Farkash A.Orni F.M.d.Paula A.Nahir A.J.Hu S.Bergman G.Bobok W.Kowalski S.Koyfman S.Moran V.Paruthi W.Roesner G.Shurek V.Vuyyuru
Talks about:distribut (1) overhead (1) industri (1) unlimit (1) reorder (1) length (1) experi (1) design (1) buffer (1) verif (1)
Person: Ziv Nevo
DBLP: Nevo:Ziv
Contributed to:
2015
20112006Wrote 3 papers:
- DATE-2015-BergmanBKKMNOPR #experience #industrial #verification
- Designer-level verification: an industrial experience story (SB, GB, WK, SK, SM, ZN, AO, VP, WR, GS, VV), pp. 410–411.
- DAC-2011-PaulaNNOH #named
- TAB-BackSpace: unlimited-length trace buffers with zero additional on-chip overhead (FMdP, AN, ZN, AO, AJH), pp. 411–416.
- DAC-2006-NevoF #distributed #order
- Distributed dynamic BDD reordering (ZN, MF), pp. 223–228.