Takuji Ogihara, Shinichi Murai, Yuzo Takamatsu, Kozo Kinoshita, Hideo Fujiwara
Test generation for scan design circuits with tri-state modules and bidirectional terminals
DAC, 1983.
@inproceedings{DAC-1983-OgiharaMTKF,
acmid = "800643",
author = "Takuji Ogihara and Shinichi Murai and Yuzo Takamatsu and Kozo Kinoshita and Hideo Fujiwara",
booktitle = "{Proceedings of the 20th Design Automation Conference}",
isbn = "0-8186-0026-8",
pages = "71--78",
publisher = "{ACM/IEEE}",
title = "{Test generation for scan design circuits with tri-state modules and bidirectional terminals}",
year = 1983,
}