Travelled to:
1 × USA
Collaborated with:
T.Ogihara S.Murai K.Kinoshita H.Fujiwara
Talks about:
bidirect (1) generat (1) circuit (1) termin (1) design (1) state (1) modul (1) test (1) scan (1) tri (1)
Person: Yuzo Takamatsu
DBLP: Takamatsu:Yuzo
Contributed to:
Wrote 1 papers:
- DAC-1983-OgiharaMTKF #bidirectional #design #generative #testing
- Test generation for scan design circuits with tri-state modules and bidirectional terminals (TO, SM, YT, KK, HF), pp. 71–78.