Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture
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Nahmsuk Oh, Rohit Kapur, Thomas W. Williams, Jim Sproch
Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture
DATE, 2003.

DATE 2003
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@inproceedings{DATE-2003-OhKWS,
	acmid         = "1022713",
	author        = "Nahmsuk Oh and Rohit Kapur and Thomas W. Williams and Jim Sproch",
	booktitle     = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2003.10128",
	isbn          = "0-7695-1870-2",
	pages         = "10110--10115",
	publisher     = "{IEEE Computer Society}",
	title         = "{Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture}",
	year          = 2003,
}

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