Nahmsuk Oh, Rohit Kapur, Thomas W. Williams, Jim Sproch
Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture
DATE, 2003.
@inproceedings{DATE-2003-OhKWS,
acmid = "1022713",
author = "Nahmsuk Oh and Rohit Kapur and Thomas W. Williams and Jim Sproch",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2003.10128",
isbn = "0-7695-1870-2",
pages = "10110--10115",
publisher = "{IEEE Computer Society}",
title = "{Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture}",
year = 2003,
}