Finding the Worst Voltage Violation in Multi-Domain Clock Gated Power Network
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Wanping Zhang, Yi Zhu, Wenjian Yu, Ling Zhang, Rui Shi, He Peng, Zhi Zhu, Lew Chua-Eoan, Rajeev Murgai, Toshiyuki Shibuya, Nuriyoki Ito, Chung-Kuan Cheng
Finding the Worst Voltage Violation in Multi-Domain Clock Gated Power Network
DATE, 2008.

DATE 2008
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@inproceedings{DATE-2008-ZhangZYZSPZCMSIC,
	author        = "Wanping Zhang and Yi Zhu and Wenjian Yu and Ling Zhang and Rui Shi and He Peng and Zhi Zhu and Lew Chua-Eoan and Rajeev Murgai and Toshiyuki Shibuya and Nuriyoki Ito and Chung-Kuan Cheng",
	booktitle     = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2008.4484906",
	isbn          = "978-3-9810801-3-1",
	pages         = "537--540",
	publisher     = "{IEEE}",
	title         = "{Finding the Worst Voltage Violation in Multi-Domain Clock Gated Power Network}",
	year          = 2008,
}

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