Wanping Zhang, Yi Zhu, Wenjian Yu, Ling Zhang, Rui Shi, He Peng, Zhi Zhu, Lew Chua-Eoan, Rajeev Murgai, Toshiyuki Shibuya, Nuriyoki Ito, Chung-Kuan Cheng
Finding the Worst Voltage Violation in Multi-Domain Clock Gated Power Network
DATE, 2008.
@inproceedings{DATE-2008-ZhangZYZSPZCMSIC,
author = "Wanping Zhang and Yi Zhu and Wenjian Yu and Ling Zhang and Rui Shi and He Peng and Zhi Zhu and Lew Chua-Eoan and Rajeev Murgai and Toshiyuki Shibuya and Nuriyoki Ito and Chung-Kuan Cheng",
booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2008.4484906",
isbn = "978-3-9810801-3-1",
pages = "537--540",
publisher = "{IEEE}",
title = "{Finding the Worst Voltage Violation in Multi-Domain Clock Gated Power Network}",
year = 2008,
}
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