Travelled to:
1 × France
1 × Germany
Collaborated with:
C.Cheng W.Yu A.S.Arani X.Hu M.Popovich T.Toms X.Chen W.Zhang Y.Zhu L.Zhang R.Shi Z.Zhu L.Chua-Eoan R.Murgai T.Shibuya N.Ito
Talks about:
transistor (1) parallel (1) silicon (1) reliabl (1) network (1) circuit (1) voltag (1) violat (1) domain (1) worst (1)
Person: He Peng
DBLP: Peng:He
Contributed to:
Wrote 3 papers:
- DATE-2009-AraniHPCYPTC #3d #reliability
- Reliability aware through silicon via planning for 3D stacked ICs (ASA, XH, HP, CKC, WY, MP, TT, XC), pp. 288–291.
- DATE-2009-PengC #parallel #simulation
- Parallel transistor level full-chip circuit simulation (HP, CKC), pp. 304–307.
- DATE-2008-ZhangZYZSPZCMSIC #multi #network
- Finding the Worst Voltage Violation in Multi-Domain Clock Gated Power Network (WZ, YZ, WY, LZ, RS, HP, ZZ, LCE, RM, TS, NI, CKC), pp. 537–540.