Travelled to:
1 × Denmark
1 × France
1 × Germany
1 × Ireland
1 × South Korea
3 × USA
Collaborated with:
J.Font Ø.Haugen L.Arcega V.Pelechano J.Fons M.Ballarín P.Giner A.C.Marcén R.Lapeña O.Pastor X.Zhang F.Fleurey
Talks about:
model (8) locat (5) softwar (4) product (4) line (4) variabl (3) featur (3) algorithm (2) techniqu (2) languag (2)
Person: Carlos Cetina
DBLP: Cetina:Carlos
Contributed to:
Wrote 11 papers:
- GPCE-2015-FontAHC #metamodelling #modelling #product line
- Addressing metamodel revisions in model-based software product lines (JF, LA, ØH, CC), pp. 161–170.
- SPLC-2015-FontAHC #concept #product line
- Building software product lines from conceptualized model patterns (JF, LA, ØH, CC), pp. 46–55.
- SPLC-2015-FontBHC #automation #formal method #product line #variability
- Automating the variability formalization of a model family by means of common variability language (JF, MB, ØH, CC), pp. 411–418.
- SPLC-2010-CetinaGFP #design #guidelines #product line #prototype
- Designing and Prototyping Dynamic Software Product Lines: Techniques and Guidelines (CC, PG, JF, VP), pp. 331–345.
- SPLC-2009-CetinaHZFP #runtime #variability
- Strategies for variability transformation at run-time (CC, ØH, XZ, FF, VP), pp. 61–70.
- SPLC-2008-CetinaFP #pervasive #product line
- Applying Software Product Lines to Build Autonomic Pervasive Systems (CC, JF, VP), pp. 117–126.
- MoDELS-2016-FontAHC #algorithm #feature model #information retrieval #modelling #search-based
- Feature location in models through a genetic algorithm driven by information retrieval techniques (JF, LA, ØH, CC), pp. 272–282.
- ECMFA-2017-ArcegaFHC #feature model #modelling #on the #runtime
- On the Influence of Models at Run-Time Traces in Dynamic Feature Location (LA, JF, ØH, CC), pp. 90–105.
- MoDELS-2018-ArcegaFC #algorithm #configuration management #debugging #locality #modelling #runtime
- Evolutionary Algorithm for Bug Localization in the Reconfigurations of Models at Runtime (LA, JF, CC), pp. 90–100.
- MoDELS-2018-BallarinMPC #metric #problem
- Measures to report the Location Problem of Model Fragment Location (MB, ACM, VP, CC), pp. 189–199.
- GPCE-2017-LapenaFPC #feature model #modelling #natural language
- Analyzing the impact of natural language processing over feature location in models (RL, JF, OP, CC), pp. 63–76.