Travelled to:
1 × Germany
2 × France
Collaborated with:
F.Lombardi L.Schiano J.Dohmen B.Tasic B.Kruseman C.Hora M.v.Beurden Y.Xing
Talks about:
test (3) nanotub (2) defect (2) carbon (2) industri (1) compress (1) reliabl (1) circuit (1) analogu (1) signal (1)
Person: Hamidreza Hashempour
DBLP: Hashempour:Hamidreza
Contributed to:
Wrote 3 papers:
- DATE-2011-HashempourDTKHBX #fault #industrial #reduction #testing
- Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example (HH, JD, BT, BK, CH, MvB, YX), pp. 371–376.
- DATE-2007-HashempourL #detection #fault #modelling
- Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs (HH, FL), pp. 841–846.
- DATE-2005-HashempourSL #evaluation #reliability #testing
- Evaluation of Error-Resilience for Reliable Compression of Test Data (HH, LS, FL), pp. 1284–1289.