Travelled to:2 × Germany
3 × France
Collaborated with:K.Chakrabarty M.Seuring Z.Wang A.Leininger P.Muhmenthaler C.Liu E.S.Sogomonyan D.Marienfeld V.Ocheretnij T.Bogue H.Jürgensen Y.Zorian
Talks about:output (3) diagnosi (2) test (2) self (2) scan (2) use (2) probabilist (1) implement (1) structur (1) signatur (1)
Person: Michael Gössel
DBLP: G=ouml=ssel:Michael
Contributed to:
200620042002
19991998Wrote 6 papers:
- DATE-2006-WangCG #fault #formal method #probability #testing #using
- Test set enrichment using a probabilistic fault model and the theory of output deviations (ZW, KC, MG), pp. 1270–1275.
- DATE-v2-2004-LeiningerGM #configuration management
- Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code (AL, MG, PM), pp. 1302–1309.
- DATE-v2-2004-SogomonyanMOG #self
- A New Self-Checking Sum-Bit Duplicated Carry-Select Adder (ESS, DM, VO, MG), pp. 1360–1361.
- DATE-2002-LiuCG #identification
- An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment (CL, KC, MG), pp. 382–386.
- WIA-1999-SeuringG #automaton
- A Structural Method for Output Compaction of Sequential Automata Implemented as Circuits (MS, MG), pp. 158–163.
- DATE-1998-BogueGJZ #self
- Built-In Self-Test with an Alternating Output (TB, MG, HJ, YZ), pp. 180–184.