Travelled to:2 × France
4 × USA
Collaborated with:A.J.v.Genderen E.Schrik U.Geigenmüller P.J.H.Elias G.S.Garcea K.v.d.Kolk R.H.J.M.Otten
Talks about:extract (5) element (3) resist (3) finit (3) base (3) capacit (2) effici (2) model (2) interconnect (1) submicron (1)
Person: N. P. van der Meijs
DBLP: Meijs:N=_P=_van_der
Contributed to:
2004
20021997199619951989Wrote 7 papers:
- DATE-v2-2004-GarceaMKO #statistics
- Statistically Aware Buffer Planning (GSG, NPvdM, KJvdK, RHJMO), pp. 1402–1403.
- DAC-2002-SchrikM #modelling
- Combined BEM/FEM substrate resistance modeling (ES, NPvdM), pp. 771–776.
- EDTC-1997-GeigenmullerM #3d #integration #multi
- Cartesian multipole based numerical integration for 3D capacitance extraction (UG, NPvdM), pp. 256–259.
- DAC-1996-EliasM #modelling #scalability
- Extracting Circuit Models for Large RC Interconnections that are Accurate up to a Predefined Signal Frequency (PJHE, NPvdM), pp. 764–769.
- DAC-1996-GenderenM #performance #using
- Using Articulation Nodes to Improve the Efficiency of Finite-Element based Resistance Extraction (AJvG, NPvdM), pp. 758–763.
- DAC-1995-MeijsG
- Delayed Frontal Solution for Finite-Element Based Resistance Extraction (NPvdM, AJvG), pp. 273–278.
- DAC-1989-MeijsG #finite #performance
- An Efficient Finite Element Method for Submicron IC Capacitance Extraction (NPvdM, AJvG), pp. 678–681.