Travelled to:4 × USA
Collaborated with:S.B.K.Vrudhula P.Ghanta Y.Cao R.Panda P.Wu M.D.F.Wong I.Nedelchev V.Parkhe W.Wang S.Yang R.Vattikonda F.Liu
Talks about:circuit (3) variat (3) analysi (2) scale (2) intra (2) nano (2) die (2) systemat (1) stochast (1) sequenti (1)
Person: Sarvesh Bhardwaj
DBLP: Bhardwaj:Sarvesh
Contributed to:
2014200720062005Wrote 5 papers:
- DAC-2014-WuWNBP #on the
- On Timing Closure: Buffer Insertion for Hold-Violation Removal (PCW, MDFW, IN, SB, VP), p. 6.
- DAC-2007-WangYBVVLC #performance
- The Impact of NBTI on the Performance of Combinational and Sequential Circuits (WW, SY, SB, RV, SBKV, FL, YC), pp. 364–369.
- DAC-2006-BhardwajVGC #analysis #modelling #optimisation #process
- Modeling of intra-die process variations for accurate analysis and optimization of nano-scale circuits (SB, SBKV, PG, YC), pp. 791–796.
- DAC-2006-GhantaVBP #analysis #correlation #power management #probability #scalability
- Stochastic variational analysis of large power grids considering intra-die correlations (PG, SBKV, SB, RP), pp. 211–216.
- DAC-2005-BhardwajV #random
- Leakage minimization of nano-scale circuits in the presence of systematic and random variations (SB, SBKV), pp. 541–546.