Travelled to:
1 × France
2 × USA
Collaborated with:
T.Kim ∅ S.Cho S.Yang M.J.Ciesielski
Talks about:
new (3) interconnect (1) techniqu (1) diagnosi (1) boundari (1) pattern (1) complet (1) detect (1) design (1) defect (1)
Person: Sungju Park
DBLP: Park:Sungju
Contributed to:
Wrote 3 papers:
- DAC-2004-ParkCYC #power management #testing
- A new state assignment technique for testing and low power (SP, SC, SY, MJC), pp. 510–513.
- DATE-2000-ParkK #bound #design #detection #fault
- A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects (SP, TK), pp. 458–462.
- DAC-1996-Park
- A New Complete Diagnosis Patterns for Wiring Interconnects (SP), pp. 203–208.