Wangyang Zhang, Wenjian Yu, Zeyi Wang, Zhiping Yu, Rong Jiang, Jinjun Xiong
An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation
DATE, 2008.
@inproceedings{DATE-2008-ZhangYWYJX, author = "Wangyang Zhang and Wenjian Yu and Zeyi Wang and Zhiping Yu and Rong Jiang and Jinjun Xiong", booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2008.4484739", isbn = "978-3-9810801-3-1", pages = "580--585", publisher = "{IEEE}", title = "{An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation}", year = 2008, }