An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation
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Wangyang Zhang, Wenjian Yu, Zeyi Wang, Zhiping Yu, Rong Jiang, Jinjun Xiong
An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation
DATE, 2008.

DATE 2008
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@inproceedings{DATE-2008-ZhangYWYJX,
	author        = "Wangyang Zhang and Wenjian Yu and Zeyi Wang and Zhiping Yu and Rong Jiang and Jinjun Xiong",
	booktitle     = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2008.4484739",
	isbn          = "978-3-9810801-3-1",
	pages         = "580--585",
	publisher     = "{IEEE}",
	title         = "{An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation}",
	year          = 2008,
}

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