BibSLEIGH — Jinjun

Travelled to:

1 × France
3 × Germany
7 × USA

Collaborated with:

V.Zolotov C.Visweswariah L.He N.Venkateswaran B.Wang Y.Shi R.Shen S.X.Tan L.Cheng K.H.Tam D.Sinha J.Chung J.A.Abraham P.A.Habitz D.K.Beece Y.Liu W.Zhang W.Yu Z.Wang Z.Yu R.Jiang C.Zhang P.Deng H.Geng J.Liu Q.Zhu Ahmed H. M. O. Abulila Vikram Sharma Mailthody Zaid Qureshi Jian Huang 0006 N.S.Kim Wen-Mei W. Hwu J.G.Hemmett E.A.Foreman J.Leitzen

Talks about:

statist (9) time (5) variat (4) process (3) analysi (3) correl (3) consid (3) chip (3) spatial (2) general (2)

Person: Jinjun Xiong

DBLP: Xiong:Jinjun

Contributed to:

2014

2012

2011

2010

2009

2008

2007

2006

2005

2004

2019

Wrote 17 papers:

DATE-2014-ZhangDGLZXS #framework #named #simulation: MSim: A general cycle accurate simulation platform for memcomputing studies (CZ, PD, HG, JL, QZ, JX, YS), pp. 1–5.
KDD-2014-WangX #metric #novel: Novel geospatial interpolation analytics for general meteorological measurements (BW, JX), pp. 1553–1562.
DAC-2012-SinhaVVXZ #concept #statistics: Reversible statistical max/min operation: concept and applications to timing (DS, CV, NV, JX, VZ), pp. 1067–1073.
DAC-2012-ZolotovSHFVXLV #analysis #statistics: Timing analysis with nonseparable statistical and deterministic variations (VZ, DS, JGH, EAF, CV, JX, JL, NV), pp. 1061–1066.
DAC-2011-ChungXZA #statistics #testing: Testability driven statistical path selection (JC, JX, VZ, JAA), pp. 417–422.
DAC-2010-BeeceXVZL #parametricity: Transistor sizing of custom high-performance digital circuits with parametric yield considerations (DKB, JX, CV, VZ, YL), pp. 781–786.
DAC-2010-ShenTX #algorithm #analysis #correlation #linear #power management #statistics: A linear algorithm for full-chip statistical leakage power analysis considering weak spatial correlation (RS, SXDT, JX), pp. 481–486.
DAC-2009-XiongSZV #multi #process #statistics: Statistical multilayer process space coverage for at-speed test (JX, YS, VZ, CV), pp. 340–345.
DAC-2009-XiongVZ #correlation #ranking #statistics: Statistical ordering of correlated timing quantities and its application for path ranking (JX, CV, VZ), pp. 122–125.
DATE-2008-XiongZV #incremental: Incremental Criticality and Yield Gradients (JX, VZ, CV), pp. 1130–1135.
DATE-2008-XiongZVH: Optimal Margin Computation for At-Speed Test (JX, VZ, CV, PAH), pp. 622–627.
DATE-2008-ZhangYWYJX #correlation #performance #process #statistics: An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation (WZ, WY, ZW, ZY, RJ, JX), pp. 580–585.
DAC-2007-ChengXH #analysis #statistics: Non-Linear Statistical Static Timing Analysis for Non-Gaussian Variation Sources (LC, JX, LH), pp. 250–255.
DAC-2006-XiongZVV #statistics: Criticality computation in parameterized statistical timing (JX, VZ, NV, CV), pp. 63–68.
DATE-2005-XiongTH #process: Buffer Insertion Considering Process Variation (JX, KHT, LH), pp. 970–975.
DATE-v2-2004-XiongH #multi: Full-Chip Multilevel Routing for Power and Signal Integrity (JX, LH), pp. 1116–1123.
ASPLOS-2019-AbulilaMQHKXH #named: FlatFlash: Exploiting the Byte-Accessibility of SSDs within a Unified Memory-Storage Hierarchy (AHMOA, VSM, ZQ, JH0, NSK, JX, WMWH), pp. 971–985.