Travelled to:1 × Germany
2 × France
Collaborated with:P.Girard S.Pravossoudovitch A.Virazel M.Bastian V.Gouin C.Landrault L.Dilillo
Talks about:sram (3) techniqu (2) driver (2) design (2) write (2) fault (2) test (2) technolog (1) diagnosi (1) analysi (1)
Person: Alexandre Ney
DBLP: Ney:Alexandre
Contributed to:
200920082007Wrote 3 papers:
- DATE-2009-NeyDGPVBG #fault
- A new design-for-test technique for SRAM core-cell stability faults (AN, LD, PG, SP, AV, MB, VG), pp. 1344–1348.
- DATE-2008-NeyGPVBG
- A Design-for-Diagnosis Technique for SRAM Write Drivers (AN, PG, SP, AV, MB, VG), pp. 1480–1485.
- DATE-2007-NeyGLPVB #analysis #fault
- Slow write driver faults in 65nm SRAM technology: analysis and March test solution (AN, PG, CL, SP, AV, MB), pp. 528–533.