Travelled to:
1 × France
1 × Germany
Collaborated with:
A.Ney P.Girard S.Pravossoudovitch A.Virazel M.Bastian L.Dilillo
Talks about:
techniqu (2) design (2) sram (2) diagnosi (1) stabil (1) driver (1) write (1) fault (1) test (1) core (1)
Person: Vincent Gouin
DBLP: Gouin:Vincent
Contributed to:
Wrote 2 papers:
- DATE-2009-NeyDGPVBG #fault
- A new design-for-test technique for SRAM core-cell stability faults (AN, LD, PG, SP, AV, MB, VG), pp. 1344–1348.
- DATE-2008-NeyGPVBG
- A Design-for-Diagnosis Technique for SRAM Write Drivers (AN, PG, SP, AV, MB, VG), pp. 1480–1485.