Travelled to:
1 × Germany
1 × USA
2 × France
Collaborated with:
P.Girard S.Pravossoudovitch A.Virazel A.Ney L.Dilillo V.Gouin C.Landrault
Talks about:
sram (4) technolog (2) techniqu (2) analysi (2) driver (2) design (2) write (2) fault (2) test (2) core (2)
Person: Magali Bastian
DBLP: Bastian:Magali
Contributed to:
Wrote 4 papers:
- DATE-2009-NeyDGPVBG #fault
- A new design-for-test technique for SRAM core-cell stability faults (AN, LD, PG, SP, AV, MB, VG), pp. 1344–1348.
- DATE-2008-NeyGPVBG
- A Design-for-Diagnosis Technique for SRAM Write Drivers (AN, PG, SP, AV, MB, VG), pp. 1480–1485.
- DATE-2007-NeyGLPVB #analysis #fault
- Slow write driver faults in 65nm SRAM technology: analysis and March test solution (AN, PG, CL, SP, AV, MB), pp. 528–533.
- DAC-2005-DililloGPVB #analysis #comparison #fault #injection
- Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies (LD, PG, SP, AV, MB), pp. 857–862.