Travelled to:1 × France
4 × Germany
4 × USA
Collaborated with:K.Roy S.Bhunia S.Gangopadhyay S.B.Nasir S.Mukhopadhyay Y.Lee M.M.Budnik A.Bansal B.C.Paul H.Mahmoodi-Meimand S.Datta N.Shukla M.Cotter A.Parihar M.Nicolaidis L.Anghel N.Zergainoh Y.Zorian T.Karnik K.A.Bowman J.Tschanz S.Lu C.Tokunaga M.M.Khellah J.Kulkarni V.De D.Avresky
Talks about:current (3) test (3) analysi (2) leakag (2) comput (2) applic (2) under (2) power (2) model (2) dynam (2)
Person: Arijit Raychowdhury
DBLP: Raychowdhury:Arijit
Contributed to:
20152014
2014201220062006200520042003Wrote 9 papers:
- DAC-2015-GangopadhyayNR #power management
- Integrated power management in IoT devices under wide dynamic ranges of operation (SG, SBN, AR), p. 6.
- DAC-2014-DattaSCPR
- Neuro Inspired Computing with Coupled Relaxation Oscillators (SD, NS, MC, AP, AR), p. 6.
- DATE-2014-GangopadhyayLNR #adaptation #analysis #linear #modelling #performance
- Modeling and analysis of digital linear dropout regulators with adaptive control for high efficiency under wide dynamic range digital loads (SG, YL, SBN, AR), pp. 1–6.
- DATE-2012-NicolaidisAZZKBTLTRKKDA #design #reliability
- Design for test and reliability in ultimate CMOS (MN, LA, NEZ, YZ, TK, KAB, JT, SLL, CT, AR, MMK, JK, VD, DA), pp. 677–682.
- DAC-2006-BudnikRBR
- A high density, carbon nanotube capacitor for decoupling applications (MMB, AR, AB, KR), pp. 935–938.
- DATE-2006-RaychowdhuryPBR #case study #comparative #power management
- Ultralow power computing with sub-threshold leakage: a comparative study of bulk and SOI technologies (AR, BCP, SB, KR), pp. 856–861.
- DATE-2005-BhuniaMRR #novel #testing
- A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application (SB, HMM, AR, KR), pp. 1136–1141.
- DATE-v1-2004-BhuniaRR #analysis #using
- Trim Bit Setting of Analog Filters Using Wavelet-Based Supply Current Analysis (SB, AR, KR), pp. 704–705.
- DAC-2003-MukhopadhyayRR #estimation #logic #modelling
- Accurate estimation of total leakage current in scaled CMOS logic circuits based on compact current modeling (SM, AR, KR), pp. 169–174.